MAPS: Difference between revisions

From Anemos wiki
No edit summary
Tags: Reverted Visual edit
 
(51 intermediate revisions by the same user not shown)
Line 1: Line 1:
Multi-axis Absolute Position Sensor, MAPS, simultaneously measures one to a full six position dimensions, 6DoF, at one point in space with phenomenal accuracy using a single, tiny sensor-head. The patented system includes a patterned scale (the metrological reference or map) which is key to its sensitivity and practically unlimited resolution down to picometre, nanoradians levels. Drastically reducing Abbe and other errors, MAPS revolutionises mechatronics. And all this without cumbersome lasers. System combinations are available at value points covering diverse applications including metrology, machine tools, microscopy, nanotech, robotics, and more. This extraordinary technology is performance proven and traceable to world-renown metrology labs.[[File:MAPS-system-diagram.jpg|800px|center|alt=Conceptual diagram of a MAPS system.|Conceptual diagram of a MAPS system.]]
Anemos' Multi-axis Absolute Position Sensors, MAPS, simultaneously measure one to a full six position dimensions. Capturing position with phenomenal accuracy in six degrees of freedom, 6DoF, from one point in space using a single, tiny sensor is a world-first in metrology. This scalable and disruptive technology opens up a vast range of applications with its compact, all-axis, point-of-interest measuring capability, is performance proven and traceable to renown metrology authorities. First conceived to radically simplify mechatronics design while decimating Abbe and other errors, MAPS now also offers precision in its highest performance metrology versions far beyond original expectations and unparalleled in industry.  


Anemos’ revolutionary MAPS (Multi-axis Absolute Position Sensor) technology measures 6DoF position with extraordinary accuracy – one to all six dimensions at the same time using a single, tiny sensor head. The patented system includes a patterned scale (the metrological reference ormap) which is key to MAPS’ sensitivity (down to picometre, nanoradian) and practically unlimited resolution. Scale and sensor system combinations are available at a range of value points to meet accuracy and motion needs over a broad range of applications for metrology, machine tools, microscopy, nanotech, robotics and many others.
The patented<ref>UK and US patents granted, other international applications in progress. [https://worldwide.espacenet.com/patent/search/family/063518374/publication/GB2576164A?q=pn%3DGB2576164A Espacenet.]</ref> system is made up of a scale, a sensor head, and a processor (no cumbersome lasers). The specially patterned scale (the metrological reference or map) is key to its functionality and practically unlimited resolution down to picometre, nanoradians levels. The sensor head is a purpose-built camera system and images from it are processed off-board by a high-performance embedded GPU in current products. Application and communication software runs on the Linux processor for flexible, high-level product integration.


This game-changing technology opens new doors to a vast range of applications.
[[File:MAPS-system-diagram.jpg|800px|center|alt=Conceptual diagram of a MAPS system.|Conceptual diagram of a MAPS system.]]
== Multi-DOF Measurement ==
<!-- popup [[File:MAPS-system-diagram.jpg]] -->== Multi-DoF measurement ==
Accurately measuring position in 6 dimensions is a revolutionary idea that drives a whole new mindset in mechanical design providing exceptional possibilities to motion systems design and optimization. Unlike traditional encoders, which can measure only one degree of freedom, unaware of errors in other directions that influence downstream axes; MAPS encoders can measure the errors for one axis and compensate for in the next.
Six degree-of-freedom (6DoF) dimensional metrology is a comprehensive solution that offers many advantages over single axis position sensors, though one that historically has been complex and expensive to achieve. The key benefit of 6DoF is that it simultaneously measures all six degrees of freedom, linear displacement (X, Y, Z), angular displacement (yaw, pitch, roll).
[[File:Lab10nmTrochoids.gif|thumb|A test image and text.]]


Moreover, no longer do machines require heavy and expensive constraints (mechanical ways and bearings) to force movement into a single highly accurate —therefore measurable— dimension over several individual axes. Instead, move objects with several degrees of freedom while directly compensating for bearing inaccuracies, overcome squareness/parallelism, rotational runout, and stiffness problems. Decimate associated costs with simple, multi-dimensional sensors in both new designs and retrofits. We say: liberate machines with new design freedoms: kinematics unchained!
Accurately measuring position in all 6 dimensions is a revolutionary idea that drives a whole new mindset in mechanical design providing exceptional possibilities to motion systems design and optimisation. Unlike traditional encoders, which can measure only one degree of freedom oblivious of the errors in other directions that influence downstream axes, MAPS encoders can measure the errors introduced on one axis and often compensate for it in subsequent motion stages. This liberates machines with new design freedoms: kinematics unchained!


== MAPS System Components ==
Moreover, no longer do machines require heavy and expensive constraints (mechanical ways and bearings) to force motion into a single highly accurate (therefore measurable) dimension over several individual axes. In single-axis per stage designs the positioning accuracy is only as good as the motion control system conflated with the mechanical constraint precision, which is clearly exponentially more costly going from the micron to nanometre scale. Conversely with MAPS, objects or stages can move with several degrees of freedom while directly compensating for bearing inaccuracies, overcoming squareness/parallelism, Abbe errors, rotational runout, and stiffness problems. Hence, cost, size and weight can be decimated with simple, multi-dimensional sensors in both new designs and retrofits.
 
== MAPS system components ==
=== Scale ===
=== Scale ===
The scale provides the absolute metrological reference.
Anemos scales establish the metrological reference and are at the foundation of its unique capabilities. Scales can be as simple as a piece of printed paper or as sophisticated as a meticulously calibrated photolithographic plate that provide the highest precision available in industry – even for individual axes. Hence, cost/performance is adaptable to a wide range of applications and price points.  


=== Sensor head ===
=== Sensor head ===
The sensors position relative to the scale is what is measured.
The sensor's position relative to the scale is measured by capturing an image from the perspective of the sensor and processing it. The sensor head is essentially a specialised camera with greatly enhanced temperature and mechanical stability and control compared to common industrial cameras. Strobe lighting ensures blur-free imaging and precise sampling times.  


=== Processor ===
=== Processor ===
Images captured from the perspective of the sensor are processed to calculate the relative position.
MAPS systems include high-performance GPU image processors alongside general purpose computer running Anemos software (not currently open to customers). Images captured by the sensor head are processed to calculate the relative position of the sensor to the scale. To generate the final multi-axis position output, proprietary algorithms manipulate large image data sets using huge amounts of computational power. The results are used internally by embedded applications such as the built-in [[MAPS webUI|web user interface]] or sent out over a network connection. The [[MAPS communication and control protocol|communication and control protocol]] runs over secure [[wikipedia:WebSocket|WebSockets]]  and can be accessed remotely point-to-point across the Internet.  
== Position Sensor Comparison ==
== Key features     ==
Like conventional optical position sensors, MAPS has two main measuring parts: a patterned scale which establishes the metrological reference (essentially a map), and a moving sensor-head that images the scale that is processed to determine absolute position.  
 
=== Multi-axis, 6DoF capable ===
 
=== Absolute not incremental ===
 
=== Ultra-precision to picometres ===
 
=== Work-point measurement ===
 
=== Compact sensor head ===
 
=== Scalable cost/performance ===
 
=== Smart, integrated platform ===
 
=== Laser-free, non-interferometric ===
 
=== Extremely precise, limited sample rate ===
 
== Position sensors comparison ==
Like conventional optical position sensors, MAPS has two main measuring parts: a patterned scale which establishes the metrological reference (essentially a map), and a moving sensor-head that looks at the scale and that image is processed to determine absolute position.  


At the top end of metrology, MAPS competitive advantages over classic and costly optical interferometers (OI) are significant. OI’s with their incremental and limited interpolation resolution, attendant Abbe errors, susceptibility to atmospheric conditions, arduous setup requirements, and, not least, mono dimensionality. For calibration applications, Anemos sensor systems and application software provide accurate, repeatable metrology tools that are quick and simple to setup and tear down in the field. For instance, drop an Anemos scale onto a CMM/CNC bed, place a MAPS 6DoF sensor in the chuck, drive around and measure in minutes. Come back a week later, repeat and compare. Simple, fast, repeatable, and unbelievably accurate. Compare this with a whole day necessary to setup interferometer systems.
At the top end of metrology, MAPS competitive advantages over classic and costly optical interferometers (OI) are significant. OI’s with their incremental and limited interpolation resolution, attendant Abbe errors, susceptibility to atmospheric conditions, arduous setup requirements, and, not least, mono dimensionality. For calibration applications, Anemos sensor systems and application software provide accurate, repeatable metrology tools that are quick and simple to setup and tear down in the field. For instance, drop an Anemos scale onto a CMM/CNC bed, place a MAPS 6DoF sensor in the chuck, drive around and measure in minutes. Come back a week later, repeat and compare. Simple, fast, repeatable, and unbelievably accurate. Compare this with a whole day necessary to setup interferometer systems.


== MAPS Products ==
== MAPS product lines ==


Anemos MAPS product lines are grouped into three categories according to capability and target applications.  
Anemos’ revolutionary MAPS systems are available with scale and sensor system combinations to meet accuracy and motion envelope needs for a broad range of applications for metrology, machine tools, microscopy, nanotech, robotics and many others. System combinations are divided into three basic categories according to capability, target applications, and value points.  


'''Mistral''' sensors are mid-performance devices targeted at submicron XY stage, CNC, CMM, or similar calibration tasks.  
'''Mistral''' sensors are mid-performance devices targeted at submicron XY stage, CNC, CMM, or similar calibration tasks.  


'''Scirocco''' series use high resolution scales yielding sub-nanometre performance for nanotech industries and microscopy.
'''Scirocco''' series use high resolution scales yielding sub-nanometre performance for nanotech industries and advanced microscopy.
 
'''Zephyr''' the ultimate in precise metrology. Multi-MAPS sensor arrangements further enhance all 6DoF axes to subatomic resolution, and in particular deliver uncompromising accuracy on all rotational axes simultaneously.


'''Zephyr''' the ultimate in precise metrology. Multi-MAPS sensor arrangements further enhance all 6DoF axes and in particular deliver uncompromising accuracy on all rotational axes simultaneously offering subatomic system resolution.
== References ==

Latest revision as of 17:57, 7 February 2024

Anemos' Multi-axis Absolute Position Sensors, MAPS, simultaneously measure one to a full six position dimensions. Capturing position with phenomenal accuracy in six degrees of freedom, 6DoF, from one point in space using a single, tiny sensor is a world-first in metrology. This scalable and disruptive technology opens up a vast range of applications with its compact, all-axis, point-of-interest measuring capability, is performance proven and traceable to renown metrology authorities. First conceived to radically simplify mechatronics design while decimating Abbe and other errors, MAPS now also offers precision in its highest performance metrology versions far beyond original expectations and unparalleled in industry.

The patented[1] system is made up of a scale, a sensor head, and a processor (no cumbersome lasers). The specially patterned scale (the metrological reference or map) is key to its functionality and practically unlimited resolution down to picometre, nanoradians levels. The sensor head is a purpose-built camera system and images from it are processed off-board by a high-performance embedded GPU in current products. Application and communication software runs on the Linux processor for flexible, high-level product integration.

Conceptual diagram of a MAPS system.

Multi-DoF measurement

Six degree-of-freedom (6DoF) dimensional metrology is a comprehensive solution that offers many advantages over single axis position sensors, though one that historically has been complex and expensive to achieve. The key benefit of 6DoF is that it simultaneously measures all six degrees of freedom, linear displacement (X, Y, Z), angular displacement (yaw, pitch, roll).

Accurately measuring position in all 6 dimensions is a revolutionary idea that drives a whole new mindset in mechanical design providing exceptional possibilities to motion systems design and optimisation. Unlike traditional encoders, which can measure only one degree of freedom oblivious of the errors in other directions that influence downstream axes, MAPS encoders can measure the errors introduced on one axis and often compensate for it in subsequent motion stages. This liberates machines with new design freedoms: kinematics unchained!

Moreover, no longer do machines require heavy and expensive constraints (mechanical ways and bearings) to force motion into a single highly accurate (therefore measurable) dimension over several individual axes. In single-axis per stage designs the positioning accuracy is only as good as the motion control system conflated with the mechanical constraint precision, which is clearly exponentially more costly going from the micron to nanometre scale. Conversely with MAPS, objects or stages can move with several degrees of freedom while directly compensating for bearing inaccuracies, overcoming squareness/parallelism, Abbe errors, rotational runout, and stiffness problems. Hence, cost, size and weight can be decimated with simple, multi-dimensional sensors in both new designs and retrofits.

MAPS system components

Scale

Anemos scales establish the metrological reference and are at the foundation of its unique capabilities. Scales can be as simple as a piece of printed paper or as sophisticated as a meticulously calibrated photolithographic plate that provide the highest precision available in industry – even for individual axes. Hence, cost/performance is adaptable to a wide range of applications and price points.

Sensor head

The sensor's position relative to the scale is measured by capturing an image from the perspective of the sensor and processing it. The sensor head is essentially a specialised camera with greatly enhanced temperature and mechanical stability and control compared to common industrial cameras. Strobe lighting ensures blur-free imaging and precise sampling times.

Processor

MAPS systems include high-performance GPU image processors alongside general purpose computer running Anemos software (not currently open to customers). Images captured by the sensor head are processed to calculate the relative position of the sensor to the scale. To generate the final multi-axis position output, proprietary algorithms manipulate large image data sets using huge amounts of computational power. The results are used internally by embedded applications such as the built-in web user interface or sent out over a network connection. The communication and control protocol runs over secure WebSockets and can be accessed remotely point-to-point across the Internet.

Key features    

Multi-axis, 6DoF capable

Absolute not incremental

Ultra-precision to picometres

Work-point measurement

Compact sensor head

Scalable cost/performance

Smart, integrated platform

Laser-free, non-interferometric

Extremely precise, limited sample rate

Position sensors comparison

Like conventional optical position sensors, MAPS has two main measuring parts: a patterned scale which establishes the metrological reference (essentially a map), and a moving sensor-head that looks at the scale and that image is processed to determine absolute position.

At the top end of metrology, MAPS competitive advantages over classic and costly optical interferometers (OI) are significant. OI’s with their incremental and limited interpolation resolution, attendant Abbe errors, susceptibility to atmospheric conditions, arduous setup requirements, and, not least, mono dimensionality. For calibration applications, Anemos sensor systems and application software provide accurate, repeatable metrology tools that are quick and simple to setup and tear down in the field. For instance, drop an Anemos scale onto a CMM/CNC bed, place a MAPS 6DoF sensor in the chuck, drive around and measure in minutes. Come back a week later, repeat and compare. Simple, fast, repeatable, and unbelievably accurate. Compare this with a whole day necessary to setup interferometer systems.

MAPS product lines

Anemos’ revolutionary MAPS systems are available with scale and sensor system combinations to meet accuracy and motion envelope needs for a broad range of applications for metrology, machine tools, microscopy, nanotech, robotics and many others. System combinations are divided into three basic categories according to capability, target applications, and value points.

Mistral sensors are mid-performance devices targeted at submicron XY stage, CNC, CMM, or similar calibration tasks.

Scirocco series use high resolution scales yielding sub-nanometre performance for nanotech industries and advanced microscopy.

Zephyr the ultimate in precise metrology. Multi-MAPS sensor arrangements further enhance all 6DoF axes to subatomic resolution, and in particular deliver uncompromising accuracy on all rotational axes simultaneously.

References

  1. UK and US patents granted, other international applications in progress. Espacenet.